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Infra-Red (IR)

 

 

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4.     A noise rating of an individual detector element which specifies
the amount of blackbody temperature variation required to produce an output signal equal to the detector's rms noise.

5.    A noise rating of an individual detector element which specifies the amount of blackbody power variation
required to produce an output signal equal to the detector's rms noise.

7.     A matrix of detector cells attached to a semiconductor chip.

8.     Noise originating from sources outside the detector.

8.     Semiconductor manufacturing technology in which a silicon wafer is etched
with small circuits that allow for signal processing.

9.   Indicates the "color" of the infrared radiation.

 

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1.     A measure of an individual detector element's performance over the range of temperatures to be observed.500°C.

2.     A parameter used to compare the performances of various detector types.

3.     The total angle within which objects can be imaged or measured and displayed by an infrared system.

6.     A material which will create extremely cold conditions.

 

 

 

 

 

 

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